A physical phantom for the calibration of three-dimensional X-ray microtomography examination

E. Perilli, F. Baruffaldi, M. C. Bisi, L. Cristofolini, A. Cappello

Research output: Contribution to journalArticle

34 Citations (Scopus)

Abstract

X-ray microtomography is rapidly gaining importance as a non-destructive investigation technique, especially in the three-dimensional examination of trabecular bone. Appropriate quantitative three-dimensional parameters describing the investigated structure were introduced, such as the model-independent thickness and the structure model index. The first parameter calculates a volume-based thickness of the structure in three dimensions independent of an assumed structure type. The second parameter estimates the characteristic form of which the structure is composed, i.e. whether it is more plate-like, rod-like or even sphere-like. These parameters are now experiencing a great diffusion and are rapidly growing in importance. To measure the accuracy of these three-dimensional parameters, a physical three-dimensional phantom containing different known geometries and thicknesses, resembling those of the examined structures, is needed. Unfortunately, such particular phantoms are not commonly available and neither does a consolidated standard exist. This work describes the realization of a calibration phantom for three-dimensional X-ray microtomography examination and reports an application example using an X-ray microtomography system. The calibration phantom (external size 13 mm diameter, 23 mm height) was based on various aluminium inserts embedded in a cylinder of polymethylmethacrylate. The inserts had known geometries (wires, foils, meshes and spheres) and thicknesses (ranging from 20 μm to 1 mm). The phantom was successfully applied to an X-ray microtomography device, providing imaging of the inserted structures and calculation of three-dimensional parameters such as the model-independent thickness and the structure model index. With the indications given in the present work it is possible to design a similar phantom in a histology laboratory and to adapt it to the requested applications.

Original languageEnglish
Pages (from-to)124-134
Number of pages11
JournalJournal of Microscopy
Volume222
Issue number2
DOIs
Publication statusPublished - May 2006

Fingerprint

X-Ray Microtomography
Calibration
examination
X rays
Model structures
x rays
inserts
Histology
Die casting inserts
Geometry
Polymethyl Methacrylate
Aluminum
Metal foil
Bone
histology
Wire
geometry
Imaging techniques
Equipment and Supplies
bones

Keywords

  • Histomorphometry
  • Model-independent thickness
  • Phantom
  • Plates
  • Rods
  • Structure model index
  • Trabecular bone
  • X-ray microtomography

ASJC Scopus subject areas

  • Instrumentation

Cite this

A physical phantom for the calibration of three-dimensional X-ray microtomography examination. / Perilli, E.; Baruffaldi, F.; Bisi, M. C.; Cristofolini, L.; Cappello, A.

In: Journal of Microscopy, Vol. 222, No. 2, 05.2006, p. 124-134.

Research output: Contribution to journalArticle

Perilli, E. ; Baruffaldi, F. ; Bisi, M. C. ; Cristofolini, L. ; Cappello, A. / A physical phantom for the calibration of three-dimensional X-ray microtomography examination. In: Journal of Microscopy. 2006 ; Vol. 222, No. 2. pp. 124-134.
@article{28903c3d9fd64ae4939d853a9f1bbbb6,
title = "A physical phantom for the calibration of three-dimensional X-ray microtomography examination",
abstract = "X-ray microtomography is rapidly gaining importance as a non-destructive investigation technique, especially in the three-dimensional examination of trabecular bone. Appropriate quantitative three-dimensional parameters describing the investigated structure were introduced, such as the model-independent thickness and the structure model index. The first parameter calculates a volume-based thickness of the structure in three dimensions independent of an assumed structure type. The second parameter estimates the characteristic form of which the structure is composed, i.e. whether it is more plate-like, rod-like or even sphere-like. These parameters are now experiencing a great diffusion and are rapidly growing in importance. To measure the accuracy of these three-dimensional parameters, a physical three-dimensional phantom containing different known geometries and thicknesses, resembling those of the examined structures, is needed. Unfortunately, such particular phantoms are not commonly available and neither does a consolidated standard exist. This work describes the realization of a calibration phantom for three-dimensional X-ray microtomography examination and reports an application example using an X-ray microtomography system. The calibration phantom (external size 13 mm diameter, 23 mm height) was based on various aluminium inserts embedded in a cylinder of polymethylmethacrylate. The inserts had known geometries (wires, foils, meshes and spheres) and thicknesses (ranging from 20 μm to 1 mm). The phantom was successfully applied to an X-ray microtomography device, providing imaging of the inserted structures and calculation of three-dimensional parameters such as the model-independent thickness and the structure model index. With the indications given in the present work it is possible to design a similar phantom in a histology laboratory and to adapt it to the requested applications.",
keywords = "Histomorphometry, Model-independent thickness, Phantom, Plates, Rods, Structure model index, Trabecular bone, X-ray microtomography",
author = "E. Perilli and F. Baruffaldi and Bisi, {M. C.} and L. Cristofolini and A. Cappello",
year = "2006",
month = "5",
doi = "10.1111/j.1365-2818.2006.01580.x",
language = "English",
volume = "222",
pages = "124--134",
journal = "Journal of Microscopy",
issn = "0022-2720",
publisher = "Wiley-Blackwell",
number = "2",

}

TY - JOUR

T1 - A physical phantom for the calibration of three-dimensional X-ray microtomography examination

AU - Perilli, E.

AU - Baruffaldi, F.

AU - Bisi, M. C.

AU - Cristofolini, L.

AU - Cappello, A.

PY - 2006/5

Y1 - 2006/5

N2 - X-ray microtomography is rapidly gaining importance as a non-destructive investigation technique, especially in the three-dimensional examination of trabecular bone. Appropriate quantitative three-dimensional parameters describing the investigated structure were introduced, such as the model-independent thickness and the structure model index. The first parameter calculates a volume-based thickness of the structure in three dimensions independent of an assumed structure type. The second parameter estimates the characteristic form of which the structure is composed, i.e. whether it is more plate-like, rod-like or even sphere-like. These parameters are now experiencing a great diffusion and are rapidly growing in importance. To measure the accuracy of these three-dimensional parameters, a physical three-dimensional phantom containing different known geometries and thicknesses, resembling those of the examined structures, is needed. Unfortunately, such particular phantoms are not commonly available and neither does a consolidated standard exist. This work describes the realization of a calibration phantom for three-dimensional X-ray microtomography examination and reports an application example using an X-ray microtomography system. The calibration phantom (external size 13 mm diameter, 23 mm height) was based on various aluminium inserts embedded in a cylinder of polymethylmethacrylate. The inserts had known geometries (wires, foils, meshes and spheres) and thicknesses (ranging from 20 μm to 1 mm). The phantom was successfully applied to an X-ray microtomography device, providing imaging of the inserted structures and calculation of three-dimensional parameters such as the model-independent thickness and the structure model index. With the indications given in the present work it is possible to design a similar phantom in a histology laboratory and to adapt it to the requested applications.

AB - X-ray microtomography is rapidly gaining importance as a non-destructive investigation technique, especially in the three-dimensional examination of trabecular bone. Appropriate quantitative three-dimensional parameters describing the investigated structure were introduced, such as the model-independent thickness and the structure model index. The first parameter calculates a volume-based thickness of the structure in three dimensions independent of an assumed structure type. The second parameter estimates the characteristic form of which the structure is composed, i.e. whether it is more plate-like, rod-like or even sphere-like. These parameters are now experiencing a great diffusion and are rapidly growing in importance. To measure the accuracy of these three-dimensional parameters, a physical three-dimensional phantom containing different known geometries and thicknesses, resembling those of the examined structures, is needed. Unfortunately, such particular phantoms are not commonly available and neither does a consolidated standard exist. This work describes the realization of a calibration phantom for three-dimensional X-ray microtomography examination and reports an application example using an X-ray microtomography system. The calibration phantom (external size 13 mm diameter, 23 mm height) was based on various aluminium inserts embedded in a cylinder of polymethylmethacrylate. The inserts had known geometries (wires, foils, meshes and spheres) and thicknesses (ranging from 20 μm to 1 mm). The phantom was successfully applied to an X-ray microtomography device, providing imaging of the inserted structures and calculation of three-dimensional parameters such as the model-independent thickness and the structure model index. With the indications given in the present work it is possible to design a similar phantom in a histology laboratory and to adapt it to the requested applications.

KW - Histomorphometry

KW - Model-independent thickness

KW - Phantom

KW - Plates

KW - Rods

KW - Structure model index

KW - Trabecular bone

KW - X-ray microtomography

UR - http://www.scopus.com/inward/record.url?scp=33745103045&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=33745103045&partnerID=8YFLogxK

U2 - 10.1111/j.1365-2818.2006.01580.x

DO - 10.1111/j.1365-2818.2006.01580.x

M3 - Article

C2 - 16774521

AN - SCOPUS:33745103045

VL - 222

SP - 124

EP - 134

JO - Journal of Microscopy

JF - Journal of Microscopy

SN - 0022-2720

IS - 2

ER -