Artifacts-free fourier ptychographic microscopy using a misaligned setup

V. Bianco, B. Mandracchia, J. Běhal, D. Barone, P. Memmolo, P. Ferraro

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Fourier Ptychographic Microscopy (FPM) probes biological samples from multiple directions and provides amplitude and quantitative phase-contrast imaging in label-free modality with large space-bandwidth product. FPM is suitable to analyze tissues in hospitals and analysis labs by unskilled users. However, whenever the FPM setup is misaligned, phase artifacts can prevent a correct retrieval of the sample complex amplitude. Here we show a blind method, named Multi-Look FPM, which eliminates the unwanted artifacts and allows non-expert users skipping the recalibration process. Multi-Look FPM is proved effective in the case of neural tissue slides, cell layers, and marine microalgae with complex inner structures.

Original languageEnglish
Title of host publicationOptical Methods for Inspection, Characterization, and Imaging of Biomaterials V
EditorsPietro Ferraro, Simonetta Grilli, Monika Ritsch-Marte, Christoph K. Hitzenberger
PublisherSPIE
ISBN (Electronic)9781510644069
DOIs
Publication statusPublished - 2021
EventOptical Methods for Inspection, Characterization, and Imaging of Biomaterials V 2021 - Virtual, Online, Germany
Duration: Jun 21 2021Jun 25 2021

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume11786
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Conference

ConferenceOptical Methods for Inspection, Characterization, and Imaging of Biomaterials V 2021
Country/TerritoryGermany
CityVirtual, Online
Period6/21/216/25/21

Keywords

  • Calibration
  • Fourier ptychographic microscopy
  • Image processing
  • Multi-look
  • Phase-contrast imaging

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

Fingerprint

Dive into the research topics of 'Artifacts-free fourier ptychographic microscopy using a misaligned setup'. Together they form a unique fingerprint.

Cite this