Atomic force microscopy in ophthalmic surgery

Maria P. De Santo, Marco Lombardo, Sebastiane Serrao, Giuseppe Lombardo, Riccardo Barberi

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

Refractive errors are some of the most common ophthalmic abnormalities. The introduction of excimer laser technology in refractive corneal surgery aims to eliminate all or the major part of the first corneal surface optical aberrations through the modelling of the corneal surface. Among the main causes of post-operative aberrations are the new corneal profile created by laser and the roughness of the treated surface. It is mandatory for an optimal surgical outcome that the treated surface be as similar as possible to the natural architecture of the cornea. The aim of this study is to evaluate the corneal topography before and after the laser treatment by means of Atomic Force Microscopy.

Original languageEnglish
Title of host publication2004 4th IEEE Conference on Nanotechnology
Pages562-564
Number of pages3
Publication statusPublished - 2004
Event2004 4th IEEE Conference on Nanotechnology - Munich, Germany
Duration: Aug 16 2004Aug 19 2004

Other

Other2004 4th IEEE Conference on Nanotechnology
CountryGermany
CityMunich
Period8/16/048/19/04

Fingerprint

Surgery
Atomic force microscopy
Aberrations
Lasers
Excimer lasers
Topography
Surface roughness

Keywords

  • Atomic force microscopy
  • Biomedical materials
  • Excimer lasers
  • Laser biomedical applications
  • Surgery

ASJC Scopus subject areas

  • Engineering(all)

Cite this

De Santo, M. P., Lombardo, M., Serrao, S., Lombardo, G., & Barberi, R. (2004). Atomic force microscopy in ophthalmic surgery. In 2004 4th IEEE Conference on Nanotechnology (pp. 562-564)

Atomic force microscopy in ophthalmic surgery. / De Santo, Maria P.; Lombardo, Marco; Serrao, Sebastiane; Lombardo, Giuseppe; Barberi, Riccardo.

2004 4th IEEE Conference on Nanotechnology. 2004. p. 562-564.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

De Santo, MP, Lombardo, M, Serrao, S, Lombardo, G & Barberi, R 2004, Atomic force microscopy in ophthalmic surgery. in 2004 4th IEEE Conference on Nanotechnology. pp. 562-564, 2004 4th IEEE Conference on Nanotechnology, Munich, Germany, 8/16/04.
De Santo MP, Lombardo M, Serrao S, Lombardo G, Barberi R. Atomic force microscopy in ophthalmic surgery. In 2004 4th IEEE Conference on Nanotechnology. 2004. p. 562-564
De Santo, Maria P. ; Lombardo, Marco ; Serrao, Sebastiane ; Lombardo, Giuseppe ; Barberi, Riccardo. / Atomic force microscopy in ophthalmic surgery. 2004 4th IEEE Conference on Nanotechnology. 2004. pp. 562-564
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