Dual floor burr hole technique in deep brain stimulation: A retrospective study on 209 patients

Domenico Servello, Christian Saleh, Alberto R Bona, Marina Minichiello, Edvin Zekaj

Research output: Contribution to journalArticle

Abstract

Background: Skin erosion/infections due to deep brain stimulation hardware are highly worrisome complications. They can lead to the removal of the entire deep brain stimulation device, and consequently hold the whole treatment in otherwise pharmacologically refractory patients. Several techniques have been used such as C-shape skin incision and dual floor burr hole or single passage of connecting cables to reduce the incidence of skin complications.

Methods: In this paper, we describe our experience in 209 patients using a dual-floor burr hole technique to reduce skin adverse effects.

Conclusion: The dual floor burr hole technique is a safe technique with a low incidence of skin erosions and complications.

Original languageEnglish
Pages (from-to)280
JournalSurgical Neurology International
Volume8
DOIs
Publication statusPublished - 2017

Fingerprint

Deep Brain Stimulation
Retrospective Studies
Skin
Incidence
Equipment and Supplies
Infection

Keywords

  • Journal Article

Cite this

Dual floor burr hole technique in deep brain stimulation : A retrospective study on 209 patients. / Servello, Domenico; Saleh, Christian; Bona, Alberto R; Minichiello, Marina; Zekaj, Edvin.

In: Surgical Neurology International, Vol. 8, 2017, p. 280.

Research output: Contribution to journalArticle

Servello, Domenico ; Saleh, Christian ; Bona, Alberto R ; Minichiello, Marina ; Zekaj, Edvin. / Dual floor burr hole technique in deep brain stimulation : A retrospective study on 209 patients. In: Surgical Neurology International. 2017 ; Vol. 8. pp. 280.
@article{c05bc6d0f3634c009ef155ebc92ad7ff,
title = "Dual floor burr hole technique in deep brain stimulation: A retrospective study on 209 patients",
abstract = "Background: Skin erosion/infections due to deep brain stimulation hardware are highly worrisome complications. They can lead to the removal of the entire deep brain stimulation device, and consequently hold the whole treatment in otherwise pharmacologically refractory patients. Several techniques have been used such as C-shape skin incision and dual floor burr hole or single passage of connecting cables to reduce the incidence of skin complications.Methods: In this paper, we describe our experience in 209 patients using a dual-floor burr hole technique to reduce skin adverse effects.Conclusion: The dual floor burr hole technique is a safe technique with a low incidence of skin erosions and complications.",
keywords = "Journal Article",
author = "Domenico Servello and Christian Saleh and Bona, {Alberto R} and Marina Minichiello and Edvin Zekaj",
year = "2017",
doi = "10.4103/sni.sni_144_17",
language = "English",
volume = "8",
pages = "280",
journal = "Surgical Neurology International",
issn = "2152-7806",
publisher = "Medknow Publications and Media Pvt. Ltd",

}

TY - JOUR

T1 - Dual floor burr hole technique in deep brain stimulation

T2 - A retrospective study on 209 patients

AU - Servello, Domenico

AU - Saleh, Christian

AU - Bona, Alberto R

AU - Minichiello, Marina

AU - Zekaj, Edvin

PY - 2017

Y1 - 2017

N2 - Background: Skin erosion/infections due to deep brain stimulation hardware are highly worrisome complications. They can lead to the removal of the entire deep brain stimulation device, and consequently hold the whole treatment in otherwise pharmacologically refractory patients. Several techniques have been used such as C-shape skin incision and dual floor burr hole or single passage of connecting cables to reduce the incidence of skin complications.Methods: In this paper, we describe our experience in 209 patients using a dual-floor burr hole technique to reduce skin adverse effects.Conclusion: The dual floor burr hole technique is a safe technique with a low incidence of skin erosions and complications.

AB - Background: Skin erosion/infections due to deep brain stimulation hardware are highly worrisome complications. They can lead to the removal of the entire deep brain stimulation device, and consequently hold the whole treatment in otherwise pharmacologically refractory patients. Several techniques have been used such as C-shape skin incision and dual floor burr hole or single passage of connecting cables to reduce the incidence of skin complications.Methods: In this paper, we describe our experience in 209 patients using a dual-floor burr hole technique to reduce skin adverse effects.Conclusion: The dual floor burr hole technique is a safe technique with a low incidence of skin erosions and complications.

KW - Journal Article

U2 - 10.4103/sni.sni_144_17

DO - 10.4103/sni.sni_144_17

M3 - Article

C2 - 29279797

VL - 8

SP - 280

JO - Surgical Neurology International

JF - Surgical Neurology International

SN - 2152-7806

ER -