Dual floor burr hole technique in deep brain stimulation: A retrospective study on 209 patients

Domenico Servello, Christian Saleh, Alberto R Bona, Marina Minichiello, Edvin Zekaj

Research output: Contribution to journalArticle

Abstract

Background: Skin erosion/infections due to deep brain stimulation hardware are highly worrisome complications. They can lead to the removal of the entire deep brain stimulation device, and consequently hold the whole treatment in otherwise pharmacologically refractory patients. Several techniques have been used such as C-shape skin incision and dual floor burr hole or single passage of connecting cables to reduce the incidence of skin complications.

Methods: In this paper, we describe our experience in 209 patients using a dual-floor burr hole technique to reduce skin adverse effects.

Conclusion: The dual floor burr hole technique is a safe technique with a low incidence of skin erosions and complications.

Original languageEnglish
Pages (from-to)280
JournalSurgical Neurology International
Volume8
DOIs
Publication statusPublished - 2017

Keywords

  • Journal Article

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