Estimation of quantum noise in fluoroscopy by analyzing differences of static images

P. Bifulco, M. Romano, M. Cesarelli, L. Iuppariello, N. Pasquino

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Quantum noise is typical of images obtained with a small amount of photons and X-ray fluoroscopy is an example of the type. Indeed, to keep the doses of radiation to acceptable levels for the patient and, at the same time, to allow prolonged screening, the number of X photons is drastically reduced giving rise to a remarkable quantum noise on the images. For various applications it is necessary to estimate the level of this noise: This study proposes to use a limited number of fluoroscopic images depicting a static scene to estimate the noise. By considering the noise samples uncorrelated (e.g. for a single pixel) and computing all possible differences due to the number of images, it is possible to estimate fairly accurately the characteristics of the noise (and the gain of the sensor). Statistically, quantum noise is Poisson distributed, while the difference of two Poissonians gives a Skellam distribution. Making a difference between two static images will automatically result in cancellation of the image (the scene), whatever it is, highlighting only the noise. Using only few images it is possible to provide an estimation of noise, which is comparable (only slightly less accurate) to that should be obtained from an analysis performed with much more images.

Original languageEnglish
Title of host publication20th IMEKO TC4 Symposium on Measurements of Electrical Quantities: Research on Electrical and Electronic Measurement for the Economic Upturn, Together with 18th TC4 International Workshop on ADC and DCA Modeling and Testing, IWADC 2014
PublisherIMEKO-International Measurement Federation Secretariat
Pages790-793
Number of pages4
ISBN (Print)9789299007327
Publication statusPublished - 2014
Event20th IMEKO TC4 Symposium on Measurements of Electrical Quantities: Research on Electrical and Electronic Measurement for the Economic Upturn, Together with 18th TC4 International Workshop on ADC and DCA Modeling and Testing, IWADC 2014 - Benevento, Italy
Duration: Sep 15 2014Sep 17 2014

Other

Other20th IMEKO TC4 Symposium on Measurements of Electrical Quantities: Research on Electrical and Electronic Measurement for the Economic Upturn, Together with 18th TC4 International Workshop on ADC and DCA Modeling and Testing, IWADC 2014
CountryItaly
CityBenevento
Period9/15/149/17/14

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Modelling and Simulation
  • Instrumentation

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