Identification and validation of a lumped parameters model for the dielectric relaxation of a piezoelectric tactile sensor

D. Cattin, R. Oboe, R. S. Dahiya, M. Valle

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

This paper presents the identification of a lumped parameters model of a POSFET tactile sensor which aims to give the sense of touch to humanoid robots. A Cole-Cole model has been design in order to describe the dynamic of dielectric relaxation of the PVDF-TrFE piezoelectric polymer. The tactile sensor has been characterized in time and frequency domain. The parameters of the model have been estimated from the time domain response and validated in frequency domain.

Original languageEnglish
Title of host publicationIEEE International Symposium on Industrial Electronics
Pages452-457
Number of pages6
DOIs
Publication statusPublished - 2010
Event2010 IEEE International Symposium on Industrial Electronics, ISIE 2010 - Bari, Italy
Duration: Jul 4 2010Jul 7 2010

Other

Other2010 IEEE International Symposium on Industrial Electronics, ISIE 2010
CountryItaly
CityBari
Period7/4/107/7/10

Fingerprint

Dielectric relaxation
Identification (control systems)
Sensors
Robots
Polymers

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Control and Systems Engineering

Cite this

Cattin, D., Oboe, R., Dahiya, R. S., & Valle, M. (2010). Identification and validation of a lumped parameters model for the dielectric relaxation of a piezoelectric tactile sensor. In IEEE International Symposium on Industrial Electronics (pp. 452-457). [5637679] https://doi.org/10.1109/ISIE.2010.5637679

Identification and validation of a lumped parameters model for the dielectric relaxation of a piezoelectric tactile sensor. / Cattin, D.; Oboe, R.; Dahiya, R. S.; Valle, M.

IEEE International Symposium on Industrial Electronics. 2010. p. 452-457 5637679.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Cattin, D, Oboe, R, Dahiya, RS & Valle, M 2010, Identification and validation of a lumped parameters model for the dielectric relaxation of a piezoelectric tactile sensor. in IEEE International Symposium on Industrial Electronics., 5637679, pp. 452-457, 2010 IEEE International Symposium on Industrial Electronics, ISIE 2010, Bari, Italy, 7/4/10. https://doi.org/10.1109/ISIE.2010.5637679
Cattin D, Oboe R, Dahiya RS, Valle M. Identification and validation of a lumped parameters model for the dielectric relaxation of a piezoelectric tactile sensor. In IEEE International Symposium on Industrial Electronics. 2010. p. 452-457. 5637679 https://doi.org/10.1109/ISIE.2010.5637679
Cattin, D. ; Oboe, R. ; Dahiya, R. S. ; Valle, M. / Identification and validation of a lumped parameters model for the dielectric relaxation of a piezoelectric tactile sensor. IEEE International Symposium on Industrial Electronics. 2010. pp. 452-457
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