Abstract
This paper presents an instrument called an inverted scanning microwave microscope (iSMM), which is capable of performing noninvasive and label-free imaging and characterization of intracellular structures of a live cell on the nanometer scale. In particular, the iSMM is sensitive to not only surface structures but also electromagnetic properties up to one micrometer below the surface. Conveniently, the iSMM can be constructed through straightforward conversion of any scanning probe microscope, such as an atomic force microscope and a scanning tunneling microscope, with a simple metal probe to outperform a traditional SMM in terms of ruggedness, bandwidth, sensitivity, and dynamic range. By contrast, the application of the traditional SMM to date has been limited to mainly surface physics and semiconductor technology because the traditional SMM requires a fragile and expensive probe and is incompatible with saline solution or live cells.
| Original language | English |
|---|---|
| Article number | 093703 |
| Journal | Applied Physics Letters |
| Volume | 114 |
| Issue number | 9 |
| DOIs | |
| Publication status | Published - Mar 4 2019 |
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ASJC Scopus subject areas
- Physics and Astronomy (miscellaneous)
Cite this
Inverted scanning microwave microscope for in vitro imaging and characterization of biological cells. / Farina, Marco; Jin, Xin; Fabi, Gianluca; Pavoni, Eleonora; Di Donato, Andrea; Mencarelli, Davide; Morini, Antonio; Piacenza, Francesco; Al Hadi, Richard; Zhao, Yan; Ning, Yaqing; Pietrangelo, Tiziana; Cheng, Xuanhong; Hwang, James C.M.
In: Applied Physics Letters, Vol. 114, No. 9, 093703, 04.03.2019.Research output: Contribution to journal › Article
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TY - JOUR
T1 - Inverted scanning microwave microscope for in vitro imaging and characterization of biological cells
AU - Farina, Marco
AU - Jin, Xin
AU - Fabi, Gianluca
AU - Pavoni, Eleonora
AU - Di Donato, Andrea
AU - Mencarelli, Davide
AU - Morini, Antonio
AU - Piacenza, Francesco
AU - Al Hadi, Richard
AU - Zhao, Yan
AU - Ning, Yaqing
AU - Pietrangelo, Tiziana
AU - Cheng, Xuanhong
AU - Hwang, James C.M.
PY - 2019/3/4
Y1 - 2019/3/4
N2 - This paper presents an instrument called an inverted scanning microwave microscope (iSMM), which is capable of performing noninvasive and label-free imaging and characterization of intracellular structures of a live cell on the nanometer scale. In particular, the iSMM is sensitive to not only surface structures but also electromagnetic properties up to one micrometer below the surface. Conveniently, the iSMM can be constructed through straightforward conversion of any scanning probe microscope, such as an atomic force microscope and a scanning tunneling microscope, with a simple metal probe to outperform a traditional SMM in terms of ruggedness, bandwidth, sensitivity, and dynamic range. By contrast, the application of the traditional SMM to date has been limited to mainly surface physics and semiconductor technology because the traditional SMM requires a fragile and expensive probe and is incompatible with saline solution or live cells.
AB - This paper presents an instrument called an inverted scanning microwave microscope (iSMM), which is capable of performing noninvasive and label-free imaging and characterization of intracellular structures of a live cell on the nanometer scale. In particular, the iSMM is sensitive to not only surface structures but also electromagnetic properties up to one micrometer below the surface. Conveniently, the iSMM can be constructed through straightforward conversion of any scanning probe microscope, such as an atomic force microscope and a scanning tunneling microscope, with a simple metal probe to outperform a traditional SMM in terms of ruggedness, bandwidth, sensitivity, and dynamic range. By contrast, the application of the traditional SMM to date has been limited to mainly surface physics and semiconductor technology because the traditional SMM requires a fragile and expensive probe and is incompatible with saline solution or live cells.
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U2 - 10.1063/1.5086259
DO - 10.1063/1.5086259
M3 - Article
AN - SCOPUS:85062767660
VL - 114
JO - Applied Physics Letters
JF - Applied Physics Letters
SN - 0003-6951
IS - 9
M1 - 093703
ER -