Mental workload estimations in unilateral deafened children

Giulia Cartocci, Anton Giulio Maglione, Giovanni Vecchiato, Gianluca Di Flumeri, Alfredo Colosimo, Alessandro Scorpecci, Pasquale Marsella, Sara Giannantonio, Paolo Malerba, Gianluca Borghini, Pietro Arico, Fabio Babiloni

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Despite of technological innovations, noisy environments still constitute a challenging and stressful situation for words recognition by hearing impaired subjects. The evaluation of the mental workload imposed by the noisy environments for the recognition of the words in prelingually deaf children is then of paramount importance since it could affect the speed of the learning process during scholar period.

Original languageEnglish
Title of host publicationProceedings of the Annual International Conference of the IEEE Engineering in Medicine and Biology Society, EMBS
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages1654-1657
Number of pages4
Volume2015-November
ISBN (Print)9781424492718
DOIs
Publication statusPublished - Nov 4 2015
Event37th Annual International Conference of the IEEE Engineering in Medicine and Biology Society, EMBC 2015 - Milan, Italy
Duration: Aug 25 2015Aug 29 2015

Other

Other37th Annual International Conference of the IEEE Engineering in Medicine and Biology Society, EMBC 2015
CountryItaly
CityMilan
Period8/25/158/29/15

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ASJC Scopus subject areas

  • Computer Vision and Pattern Recognition
  • Signal Processing
  • Biomedical Engineering
  • Health Informatics

Cite this

Cartocci, G., Maglione, A. G., Vecchiato, G., Di Flumeri, G., Colosimo, A., Scorpecci, A., Marsella, P., Giannantonio, S., Malerba, P., Borghini, G., Arico, P., & Babiloni, F. (2015). Mental workload estimations in unilateral deafened children. In Proceedings of the Annual International Conference of the IEEE Engineering in Medicine and Biology Society, EMBS (Vol. 2015-November, pp. 1654-1657). [7318693] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/EMBC.2015.7318693