Removal of ocular artifacts for high resolution EEG studies: A simulation study

Laura Astolfi, Febo Cincotti, Donatella Mattia, Fabio Babiloni, Maria Grazia Marciani, Fabrizio De Vico Fallani, Marco Mattiocco, Fumikazu Miwakeichi, Yoko Yamaguchi, Pablo Martinez, Serenella Salinari, Andrea Tocci, Hovagim Bakardjian, Francois Benoit Vialatte, Andrzej Cichocki

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Eye movements and blinks may produce unusual voltage changes that propagates from the eyeball through the head as volume conductor up to the scalp electrodes, generating severe electroencephalographic artifacts. Several methods are now available to correct the distortion Induced by these events on the EEG, having different advantages and drawbacks. The main focus of this work is to quantify the performance of the removal of EOG artifact due to the application of the independent component analysis (ICA) methodology. The precise quantification of the effects of artifact removal by ICA is possible by using a simulation setup, with a realistic head model, that it is able to mimic the occurrence of an eye blink. The electrical activity generated by the simulated eyeblink were propagated through the realistic head model and superimposed to a clean segment of EEG. Then, artifact removal was performed by using the ICA approach. Ocular artifact removal was evaluated in different operative conditions, characterized by different Signal to Noise Ratio and number of electrodes. The error measures used were the Relative Error and the Correlation Coefficient between the clear, original EEG segment and those obtained after the application of the ICA procedure.

Original languageEnglish
Title of host publicationAnnual International Conference of the IEEE Engineering in Medicine and Biology - Proceedings
Pages976-979
Number of pages4
DOIs
Publication statusPublished - 2006
Event28th Annual International Conference of the IEEE Engineering in Medicine and Biology Society, EMBS'06 - New York, NY, United States
Duration: Aug 30 2006Sep 3 2006

Other

Other28th Annual International Conference of the IEEE Engineering in Medicine and Biology Society, EMBS'06
CountryUnited States
CityNew York, NY
Period8/30/069/3/06

Fingerprint

Independent component analysis
Electroencephalography
Electrodes
Eye movements
Signal to noise ratio
Electric potential

Keywords

  • EEG
  • EOG
  • High resolution EEG
  • ICA
  • Realistic head model

ASJC Scopus subject areas

  • Bioengineering

Cite this

Astolfi, L., Cincotti, F., Mattia, D., Babiloni, F., Marciani, M. G., De Vico Fallani, F., ... Cichocki, A. (2006). Removal of ocular artifacts for high resolution EEG studies: A simulation study. In Annual International Conference of the IEEE Engineering in Medicine and Biology - Proceedings (pp. 976-979). [4029852] https://doi.org/10.1109/IEMBS.2006.260593

Removal of ocular artifacts for high resolution EEG studies : A simulation study. / Astolfi, Laura; Cincotti, Febo; Mattia, Donatella; Babiloni, Fabio; Marciani, Maria Grazia; De Vico Fallani, Fabrizio; Mattiocco, Marco; Miwakeichi, Fumikazu; Yamaguchi, Yoko; Martinez, Pablo; Salinari, Serenella; Tocci, Andrea; Bakardjian, Hovagim; Vialatte, Francois Benoit; Cichocki, Andrzej.

Annual International Conference of the IEEE Engineering in Medicine and Biology - Proceedings. 2006. p. 976-979 4029852.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Astolfi, L, Cincotti, F, Mattia, D, Babiloni, F, Marciani, MG, De Vico Fallani, F, Mattiocco, M, Miwakeichi, F, Yamaguchi, Y, Martinez, P, Salinari, S, Tocci, A, Bakardjian, H, Vialatte, FB & Cichocki, A 2006, Removal of ocular artifacts for high resolution EEG studies: A simulation study. in Annual International Conference of the IEEE Engineering in Medicine and Biology - Proceedings., 4029852, pp. 976-979, 28th Annual International Conference of the IEEE Engineering in Medicine and Biology Society, EMBS'06, New York, NY, United States, 8/30/06. https://doi.org/10.1109/IEMBS.2006.260593
Astolfi L, Cincotti F, Mattia D, Babiloni F, Marciani MG, De Vico Fallani F et al. Removal of ocular artifacts for high resolution EEG studies: A simulation study. In Annual International Conference of the IEEE Engineering in Medicine and Biology - Proceedings. 2006. p. 976-979. 4029852 https://doi.org/10.1109/IEMBS.2006.260593
Astolfi, Laura ; Cincotti, Febo ; Mattia, Donatella ; Babiloni, Fabio ; Marciani, Maria Grazia ; De Vico Fallani, Fabrizio ; Mattiocco, Marco ; Miwakeichi, Fumikazu ; Yamaguchi, Yoko ; Martinez, Pablo ; Salinari, Serenella ; Tocci, Andrea ; Bakardjian, Hovagim ; Vialatte, Francois Benoit ; Cichocki, Andrzej. / Removal of ocular artifacts for high resolution EEG studies : A simulation study. Annual International Conference of the IEEE Engineering in Medicine and Biology - Proceedings. 2006. pp. 976-979
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