Techniques, Timing, and Prognosis of Transcatheter Post Myocardial Infarction Ventricular Septal Defect Repair

Alessia Faccini, Gianfranco Butera

Research output: Contribution to journalReview articlepeer-review


Purpose of Review: This review aims to delineate the actual role of percutaneous intervention in the closure of post-myocardial infarction ventricular septal defect (post-MI VSD) and to briefly summarize the main steps of this procedure. Recent Findings: Most of the published studies report experiences using Amplatzer devices for post-MI VSD closure. In the acute phase, morbidity and mortality are quite high up to 70%, with a mean success rate of 90%, with 95% confidence intervals from 60 to 100%, and a 30-day mortality of 40%, with 95% confidence intervals from 0 to 55%. In the chronic phase, that is 14 days after myocardial infarction, results are very encouraging, with lower morbidity and mortality (23% at 30 days) and a higher rate of complete closure. A multimodality imaging approach has been proposed in order to increase the success rate of this procedure. Summary: Percutaneous closure is a safe and effective procedure in highly specialized centers and an appropriate patient selection is of paramount importance to the success of the procedure. Device closure of post-MI VSD can be considered a true alternative to the standard surgical approach. However, many problems still exist for percutaneous post-MI VSD treatment.

Original languageEnglish
Article number59
JournalCurrent Cardiology Reports
Issue number7
Publication statusPublished - Jul 1 2019


  • Percutaneous intervention
  • Post-myocardial infarction ventricular septal defect
  • Ventricular septal defect occluder

ASJC Scopus subject areas

  • Cardiology and Cardiovascular Medicine


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