Abstract
The purpose of this paper is to study the structural properties of the reconstructed bone around a prosthetic device with submicrometer spatial resolution. In particular the X-ray technique illustrated here allows to study the interface between a Zr prosthetic device and the new formed bone. The interface region formed between the device and the bone, is analysed with a spatial resolution of 0.5 micron. Obtained results gave interesting information on Zr deformation and on crystallographic phase, grain size and texture of the bone which starts to grow in this region. From the study it appears evident a marked difference in the structure of reconstructed bone with respect to the native one.
Original language | English |
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Title of host publication | Journal De Physique. IV : JP |
Editors | J. Susini, D. Joyeux, F. Polack |
Pages | 329-332 |
Number of pages | 4 |
Volume | 104 |
Publication status | Published - Mar 2003 |
Event | 7th International Conference on X-Ray Microscopy - Grenoble, France Duration: Jul 28 2002 → Aug 2 2002 |
Other
Other | 7th International Conference on X-Ray Microscopy |
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Country/Territory | France |
City | Grenoble |
Period | 7/28/02 → 8/2/02 |
ASJC Scopus subject areas
- Physics and Astronomy(all)